Au-free CMOS-compatible AlGaN/GaN HEMT processing on 200 mm Si substrates

B. de Jaeger, M. Van Hove, D. Wellekens, X. Kang, H. Liang, G. Mannaert, K. Geens, S. Decoutere
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引用次数: 83

Abstract

Au-free CMOS-compatible AlGaN/GaN HEMT devices have been processed on 200 mm Si substrates u sing a typical CMOS tool set. This paper addresses the challenges with respect to the AlGaN/GaN epitaxy, the processing of thick and bowed 200 mm GaN-on-Si wafers, the impact of Ga contamination on the tools, etc.. An enhancement mode AlGaN/GaN MISHEMT process based on barrier recess is used as demonstrator, and yielded fully functional power devices.
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在200 mm Si衬底上无au cmos兼容AlGaN/GaN HEMT加工
使用典型的CMOS工具集,在200 mm Si衬底上加工了无金CMOS兼容的AlGaN/GaN HEMT器件。本文讨论了AlGaN/GaN外延、厚度和弯曲200mm GaN-on- si晶圆的加工、Ga污染对工具的影响等方面的挑战。以一种基于势垒凹槽的增强模式AlGaN/GaN MISHEMT工艺为演示,生产出功能齐全的功率器件。
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Vertical leakage/breakdown mechanisms in AlGaN/GaN-on-Si structures Advanced 0.13um smart power technology from 7V to 70V Failure mechanisms of low-voltage trench power MOSFETs under repetitive avalanche conditions Destruction behavior of power diodes beyond the SOA limit Clamped inductive turn-off failure in high-voltage NPT-IGBTs under overloading conditions
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