A unifying formalism to support automated synthesis of SBSTs for embedded caches

S. Carlo, Giulio Gambardella, Marco Indaco, Daniele Rolfo, P. Prinetto
{"title":"A unifying formalism to support automated synthesis of SBSTs for embedded caches","authors":"S. Carlo, Giulio Gambardella, Marco Indaco, Daniele Rolfo, P. Prinetto","doi":"10.1109/EWDTS.2011.6116421","DOIUrl":null,"url":null,"abstract":"The paper presents a new unifying formalism introduced to effectively support the automatic generation of assembly test programs to be used as SBST (Software Based Self-Testing) for both data and instruction cache memories. In particular, the new formalism allows the description of the target memory, of the selected March Test algorithm, and the way this has to be customize to adapt it to the selected cache.","PeriodicalId":339676,"journal":{"name":"2011 9th East-West Design & Test Symposium (EWDTS)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 9th East-West Design & Test Symposium (EWDTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EWDTS.2011.6116421","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

The paper presents a new unifying formalism introduced to effectively support the automatic generation of assembly test programs to be used as SBST (Software Based Self-Testing) for both data and instruction cache memories. In particular, the new formalism allows the description of the target memory, of the selected March Test algorithm, and the way this has to be customize to adapt it to the selected cache.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
支持嵌入式缓存的sbst自动合成的统一形式
本文提出了一种新的统一形式,以有效地支持用于数据和指令缓存的汇编测试程序的自动生成(基于软件的自测试)。特别是,新的形式允许描述目标内存、所选择的March Test算法,并且必须对其进行自定义以使其适应所选择的缓存。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Configurable architecture for memory BIST Geometrical approach to technical diagnosing of automatons Efficient selective compaction and un-compaction of inconsequential logical design units in the schematic representation of a design A security model of individual cyberspace Optimal fluctuations for satisfactory performance under parameter uncertainty
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1