A semi-insulating/n/sup +/-structure in GaAs substrates by high energy implantation

Han Dejun, K.T. Chan, Li Guohui, Wang Wen-xun, E. Zhu
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引用次数: 1

Abstract

A structure that consists of a semi-insulating layer over a buried n/sup +/ layer (SI/n/sup +/) has been obtained by MeV Si/sup +/ implantation into SI-GaAs substrates and subsequently tailored by a very low dose O/sup +/ implantation. This novel structure has been studied by measurements of current-voltage characteristics, electrochemical C-V profiling and Hall effects. The results indicate that this structure is suitable for the provision of isolation, the fabrication of active devices and internal interconnections.<>
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高能注入GaAs衬底制备半绝缘/n/sup +/-结构
通过MeV SI/ sup +/注入到SI- gaas衬底中,然后通过极低剂量的O/sup +/注入,获得了由埋在n/sup +/层(SI/n/sup +/)上的半绝缘层组成的结构。通过测量电流-电压特性、电化学C-V谱和霍尔效应对这种新型结构进行了研究。结果表明,该结构适用于提供隔离,制造有源器件和内部互连。
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