Defect structure of high-resistivity CdTe:Cl crystals according to the data of high-resolution x-ray diffractometry

I. Fodchuk, A. Kuzmin, I. Hutsuliak, M. Solodkyi, V. Dovganyuk, O. Maslyanchuk, Y. Roman, R. Zaplitnyy, O. Gudymenko, V. Kladko, V. Mоlоdkin, V. Lizunov
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引用次数: 4

Abstract

The degree of structural perfection of CdTe:Cl single crystals was estimated by methods of high-resolution Xray diffractometry. Two possible systems of dislocations that consists of two sets of complete 60-degree dislocations and Frank partial dislocations were investigated with the use of Krivoglaz kinematic theory and Monte Carlo method. The density of dislocations that provides correspondence between experimental and simulated reciprocal space maps is determined.
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高分辨率x射线衍射数据显示高电阻率CdTe:Cl晶体的缺陷结构
用高分辨率x射线衍射法测定了CdTe:Cl单晶的结构完善程度。利用Krivoglaz运动学理论和蒙特卡罗方法研究了由两组完全60度位错和Frank部分位错组成的两种可能的位错系统。在实验和模拟的互易空间图之间提供对应关系的位错密度是确定的。
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