{"title":"Built in Test - coverage and diagnostics","authors":"Jeffrey Smith, D. Lowenstein","doi":"10.1109/AUTEST.2009.5314056","DOIUrl":null,"url":null,"abstract":"Idealy, everyone would like to embed test into their products today, whether it's to reduce costs, build in support capabilities, ensure better quality, reduce dependacy on expert technicians, or for one of many other intelligent motivations. However, it seems the technology of Built in Test (BIT) has not taken off or been adopted like many believed it would. The reasons for this poor adoption are diverse: some blame it on design, others fault product specifications and even others blame it on the fundementals of the technology itself.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2009.5314056","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
Idealy, everyone would like to embed test into their products today, whether it's to reduce costs, build in support capabilities, ensure better quality, reduce dependacy on expert technicians, or for one of many other intelligent motivations. However, it seems the technology of Built in Test (BIT) has not taken off or been adopted like many believed it would. The reasons for this poor adoption are diverse: some blame it on design, others fault product specifications and even others blame it on the fundementals of the technology itself.
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