{"title":"On the weak spot concept in the dielectric breakdown of thin polymer films","authors":"A. Saba, C. Laurent, Y. Segui","doi":"10.1109/ICSD.1989.69164","DOIUrl":null,"url":null,"abstract":"Films were prepared in a low-frequency (2.5-kHz) glow discharge diode system from hexamethyldisiloxane vapors at a pressure of 0.25 torr. Ramp and step tests were carried out to obtain voltage breakdown data. Statistical analysis of the weak-spot breakdown data shows that dielectric information can be extracted from their field functional dependence. As a consequence, these data cannot be considered as an extrinsic artefact but rather as a property of the film itself.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSD.1989.69164","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Films were prepared in a low-frequency (2.5-kHz) glow discharge diode system from hexamethyldisiloxane vapors at a pressure of 0.25 torr. Ramp and step tests were carried out to obtain voltage breakdown data. Statistical analysis of the weak-spot breakdown data shows that dielectric information can be extracted from their field functional dependence. As a consequence, these data cannot be considered as an extrinsic artefact but rather as a property of the film itself.<>
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