{"title":"CMOS low-VT preamplifier for 0.5-V gigabit-DRAM arrays","authors":"A. Kotabe, Y. Yanagawa, S. Akiyama, T. Sekiguchi","doi":"10.1109/ASSCC.2009.5357144","DOIUrl":null,"url":null,"abstract":"A novel CMOS low-VT preamplifier suitable for low-voltage and high-speed mid-point sensing was developed for gigabit DRAM. This preamplifier consists of a low-VT NMOS cross couple, a low-VT PMOS cross couple and a high-VT CMOS latch. The sensing speed of the proposed preamplifier at dataline voltage of 0.5 V is 62% higher than that of a conventional preamplifier. By activating the low-VT NMOS and PMOS cross couples temporarily during write operation, writing time is 72% shorter compared to the case with the high-VT CMOS latch only. Data-line charging current of a memory cell array with the proposed preamplifier is reduced by 26% by decreasing dataline voltage from 0.8 to 0.5V.","PeriodicalId":263023,"journal":{"name":"2009 IEEE Asian Solid-State Circuits Conference","volume":"212 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-12-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE Asian Solid-State Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASSCC.2009.5357144","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
A novel CMOS low-VT preamplifier suitable for low-voltage and high-speed mid-point sensing was developed for gigabit DRAM. This preamplifier consists of a low-VT NMOS cross couple, a low-VT PMOS cross couple and a high-VT CMOS latch. The sensing speed of the proposed preamplifier at dataline voltage of 0.5 V is 62% higher than that of a conventional preamplifier. By activating the low-VT NMOS and PMOS cross couples temporarily during write operation, writing time is 72% shorter compared to the case with the high-VT CMOS latch only. Data-line charging current of a memory cell array with the proposed preamplifier is reduced by 26% by decreasing dataline voltage from 0.8 to 0.5V.