W. Jiang, H. Le, J. Chung, T. Kopley, P. Marcoux, C. Dai
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引用次数: 21
Abstract
The major factors that cumulatively determine circuit-level hot-carrier reliability are defined and characterized in this paper. The inherent inverse relationship between lifetime-underestimation/criteria-overspecification and the amount of known device/circuit information is explored. Lifetime-underestimation/criteria-overspecification is shown to depend quite strongly on the particular "worst-case" approximations used.
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