{"title":"Oharacteristics of FIN Lines with Arbitrary Dimensions Calculated from Data for Lines in Standard Enclosures","authors":"W. Hoefer","doi":"10.1109/EUMA.1983.333237","DOIUrl":null,"url":null,"abstract":"The dispersion characteristics of fin lines with arbitrary dimensions can be obtained from data published for fin lines centered in standard waveguide enclosures. The procedure is based on the transverse resonance method which has been widely used in the past to evaluate the properties of slab-loaded waveguides, ridged waveguides and similar structures.","PeriodicalId":105436,"journal":{"name":"1983 13th European Microwave Conference","volume":"37 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1983-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1983 13th European Microwave Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUMA.1983.333237","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The dispersion characteristics of fin lines with arbitrary dimensions can be obtained from data published for fin lines centered in standard waveguide enclosures. The procedure is based on the transverse resonance method which has been widely used in the past to evaluate the properties of slab-loaded waveguides, ridged waveguides and similar structures.
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