Bo Li, B. Lu, Huo Jia, Yong Chen, Fengyuan Zhang, Zexin Su, Jantou Gao, Chunlin Wang, Wenxin Zhao, Hainan Liu
{"title":"Towards a Characterization of Vulnerability of XCR4C ASIC on Heavy-Ion Induced Transient Events","authors":"Bo Li, B. Lu, Huo Jia, Yong Chen, Fengyuan Zhang, Zexin Su, Jantou Gao, Chunlin Wang, Wenxin Zhao, Hainan Liu","doi":"10.1109/radecs47380.2019.9745654","DOIUrl":null,"url":null,"abstract":"Transients with durations of dozens of seconds in a rad-hard four-channel CDS ASIC (XCR4C) for X-ray CCD were observed during $^{181}\\mathbf{Ta}^{31+}$ ions irradiation and were attributed to the complementary feedback mechanism in the bias circuit.","PeriodicalId":269018,"journal":{"name":"2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/radecs47380.2019.9745654","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Transients with durations of dozens of seconds in a rad-hard four-channel CDS ASIC (XCR4C) for X-ray CCD were observed during $^{181}\mathbf{Ta}^{31+}$ ions irradiation and were attributed to the complementary feedback mechanism in the bias circuit.
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