X-Ray Fault Injection: Reviewing Defensive Approaches from a Security Perspective

Nasr-Eddine Ouldei Tebina, N. Zergainoh, P. Maistri
{"title":"X-Ray Fault Injection: Reviewing Defensive Approaches from a Security Perspective","authors":"Nasr-Eddine Ouldei Tebina, N. Zergainoh, P. Maistri","doi":"10.1109/DFT56152.2022.9962362","DOIUrl":null,"url":null,"abstract":"With the emergence of a novel fault injection technique based on nanofocused X-Ray beams, these attacks have been proven feasible even when using simple laboratory X-Ray sources. X-Rays can induce parametric shifts in MOS components, mostly at the level of oxides: if properly controlled, these shifts lead to reversible stuck-at faults. It is therefore established that X-Rays can indeed be considered a threat that needs to be addressed in the future when designing secure circuits. In this paper, we discuss how countermeasures issued from the state of the art can be exploited to mitigate or resist against this novel attack.","PeriodicalId":411011,"journal":{"name":"2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFT56152.2022.9962362","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

With the emergence of a novel fault injection technique based on nanofocused X-Ray beams, these attacks have been proven feasible even when using simple laboratory X-Ray sources. X-Rays can induce parametric shifts in MOS components, mostly at the level of oxides: if properly controlled, these shifts lead to reversible stuck-at faults. It is therefore established that X-Rays can indeed be considered a threat that needs to be addressed in the future when designing secure circuits. In this paper, we discuss how countermeasures issued from the state of the art can be exploited to mitigate or resist against this novel attack.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
x射线故障注入:从安全角度回顾防御方法
随着基于纳米聚焦x射线束的新型断层注入技术的出现,即使使用简单的实验室x射线源,这些攻击也被证明是可行的。x射线可以诱导MOS元件的参数位移,主要是在氧化物水平上:如果控制得当,这些位移会导致可逆的卡在故障。因此,x射线确实可以被认为是未来设计安全电路时需要解决的威胁。在本文中,我们讨论了如何利用最先进的对策来减轻或抵抗这种新型攻击。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Image Degradation due to Interacting Adjacent Hot Pixels Preventing Soft Errors and Hardware Trojans in RISC-V Cores Cross-Correlation Approach to Detecting Issue Test Sites in Massive Parallel Testing Evaluation of the Effects of SEUs on Configuration Memories in FPGA Implemented QC-LDPC Decoders Evaluating Read Disturb Effect on RRAM based AI Accelerator with Multilevel States and Input Voltages
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1