{"title":"Extended use of pseudo-flash reset technique for an active pixel with logarithmic compressed response","authors":"C. Cruz, Israel L. Marinho, D. Monteiro","doi":"10.1109/SBCCI.2012.6344425","DOIUrl":null,"url":null,"abstract":"The pseudo-flash reset (P-FRST) is a technique used to reduce image lag in CMOS active-pixel sensors (APS). The compact pixel topology consisting of a photodetector and three FETs (3T APS) is widely employed because of its large fill factor combined with the possibility to operate in both linear and logarithmic compressed-response (LCR) modes. The use of these two modes in a single readout cycle yields good low-light sensitivity and extended dynamic range (DR). However, fabrication non idealities result in fixed-pattern noise (FPN) across the image-sensor chip and cannot be reduced by classical double-sampling readout subtraction (DSRS). In the present work, we propose an extended use of the P-FRST technique to provide an adequate voltage reference on pixel, in order to enable DSRS, thus reducing FPN in conventional 3T APS operating in mixed linear-LCR mode.","PeriodicalId":311528,"journal":{"name":"2012 25th Symposium on Integrated Circuits and Systems Design (SBCCI)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 25th Symposium on Integrated Circuits and Systems Design (SBCCI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SBCCI.2012.6344425","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
The pseudo-flash reset (P-FRST) is a technique used to reduce image lag in CMOS active-pixel sensors (APS). The compact pixel topology consisting of a photodetector and three FETs (3T APS) is widely employed because of its large fill factor combined with the possibility to operate in both linear and logarithmic compressed-response (LCR) modes. The use of these two modes in a single readout cycle yields good low-light sensitivity and extended dynamic range (DR). However, fabrication non idealities result in fixed-pattern noise (FPN) across the image-sensor chip and cannot be reduced by classical double-sampling readout subtraction (DSRS). In the present work, we propose an extended use of the P-FRST technique to provide an adequate voltage reference on pixel, in order to enable DSRS, thus reducing FPN in conventional 3T APS operating in mixed linear-LCR mode.