Yue Xu, Mona Ghessemi, Jun Wang, R. Burgos, D. Boroyevich
{"title":"Electrical Field Analysis and Insulation Evaluation of a 6 kV H-bridge Power Electronics Building Block (PEBB) using 10 kV SiC MOSFET Devices","authors":"Yue Xu, Mona Ghessemi, Jun Wang, R. Burgos, D. Boroyevich","doi":"10.1109/ECCE.2018.8557489","DOIUrl":null,"url":null,"abstract":"As a consequence of higher blocking voltage and power density by using SiC devices, detailed analysis and careful design of electrical insulation are required. High partial discharge initiated from high electric field regions damages the insulation materials and leads to insulation failure. Therefore, the study of the electric field intensity distribution in all components of a high power density SiC-based converter and among multiple converters, if modular multilevel converter used, is needed. In this paper, a three-dimensional model developed in ANSYS of a high power density H-Bridge PEBB, benefiting from 10 kV SiC MOSFETs on a 6 kV DC bus, is presented. Using the finite element method, the electric field distribution inside the converter is calculated, and critical areas with high electric field intensities prone to initiate partial discharges are identified. Moreover, by using this model, geometry-based modifications are investigated to relieve high electric field regions. Finally, partial discharge tests have been applied to multiple critical parts, like the laminated bus and the interconnectors. It helps evaluate various insulation designs, provide some design guidelines and improvement suggestions for such application as well.","PeriodicalId":415217,"journal":{"name":"2018 IEEE Energy Conversion Congress and Exposition (ECCE)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE Energy Conversion Congress and Exposition (ECCE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECCE.2018.8557489","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10
Abstract
As a consequence of higher blocking voltage and power density by using SiC devices, detailed analysis and careful design of electrical insulation are required. High partial discharge initiated from high electric field regions damages the insulation materials and leads to insulation failure. Therefore, the study of the electric field intensity distribution in all components of a high power density SiC-based converter and among multiple converters, if modular multilevel converter used, is needed. In this paper, a three-dimensional model developed in ANSYS of a high power density H-Bridge PEBB, benefiting from 10 kV SiC MOSFETs on a 6 kV DC bus, is presented. Using the finite element method, the electric field distribution inside the converter is calculated, and critical areas with high electric field intensities prone to initiate partial discharges are identified. Moreover, by using this model, geometry-based modifications are investigated to relieve high electric field regions. Finally, partial discharge tests have been applied to multiple critical parts, like the laminated bus and the interconnectors. It helps evaluate various insulation designs, provide some design guidelines and improvement suggestions for such application as well.
使用10 kV SiC MOSFET器件的6 kV h桥电力电子构件(PEBB)的电场分析和绝缘评估
由于使用SiC器件具有更高的阻断电压和功率密度,因此需要详细分析和仔细设计电绝缘。高电场区引发的高局部放电会破坏绝缘材料,导致绝缘失效。因此,在采用模块化多电平变换器的情况下,有必要研究高功率密度sic基变换器各部件及多个变换器之间的电场强度分布。本文介绍了在ANSYS中建立的高功率密度h桥PEBB的三维模型,该模型得益于6 kV直流母线上10 kV SiC mosfet。采用有限元法计算了变换器内部电场分布,确定了高电场强度容易引发局部放电的临界区域。此外,利用该模型,研究了基于几何的修正以减轻高电场区域。最后,局部放电试验已应用于多个关键部件,如层压母线和互连。它有助于评估各种绝缘设计,并为此类应用提供一些设计指南和改进建议。