Asymmetric InGaAs MOSFETs with InGaAs source and InP drain

Jiongjiong Mo, E. Lind, L. Wernersson
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Abstract

Asymmetric In0.53Ga0.47As MOSFETs with different regrown contacts at source (In0.53Ga0.47As) and drain (InP) have been developed. By introducing a wider bandgap material, InP as drain electrode, higher self-gain gm/gd has been obtained with reduced output conductance gd and improved break-down voltage Vbd. For Lg=100nm, a high oscillation frequency fmax=270GHz has been obtained using an InP drain.
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具有InGaAs源极和InP漏极的非对称InGaAs mosfet
已开发出在源端(In0.53Ga0.47As)和漏端(InP)具有不同再生触点的非对称In0.53Ga0.47As mosfet。通过引入宽禁带材料InP作为漏极,在降低输出电导gd和提高击穿电压Vbd的情况下,获得了更高的自增益gm/gd。对于Lg=100nm,使用InP漏极获得了高振荡频率fmax=270GHz。
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