R. Lajmi, F. Cacho, V. Knopik, P. Cathelin, J. Lugo, P. Benech, E. L. Larroze, S. Bourdel, X. Federspiel
{"title":"Aging control of power amplifier using power detector","authors":"R. Lajmi, F. Cacho, V. Knopik, P. Cathelin, J. Lugo, P. Benech, E. L. Larroze, S. Bourdel, X. Federspiel","doi":"10.1109/IIRW.2018.8727098","DOIUrl":null,"url":null,"abstract":"Due to its high power efficiency, Class A power amplifier (PA) is a good candidate for low-cost, high integration portable communication systems, Bluetooth applications and wireless networks. It's well known that the capability of the power amplifier to deliver the output power will change in time due to the effects of Hot Carrier Injection (HCI) in CMOS transistors. In this work, investigation of power amplifier aging will be shown in the first part and compensation scheme of degraded performance using a power detector will be illustrated in the second part.","PeriodicalId":365267,"journal":{"name":"2018 International Integrated Reliability Workshop (IIRW)","volume":"70 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 International Integrated Reliability Workshop (IIRW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IIRW.2018.8727098","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract
Due to its high power efficiency, Class A power amplifier (PA) is a good candidate for low-cost, high integration portable communication systems, Bluetooth applications and wireless networks. It's well known that the capability of the power amplifier to deliver the output power will change in time due to the effects of Hot Carrier Injection (HCI) in CMOS transistors. In this work, investigation of power amplifier aging will be shown in the first part and compensation scheme of degraded performance using a power detector will be illustrated in the second part.
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