M. Sugimoto, H. Ueda, M. Kanechika, N. Soejima, T. Uesugi, T. Kachi
{"title":"Vertical device operation of AlGaN/GaN HEMTs on free-standing n-GaN substrates","authors":"M. Sugimoto, H. Ueda, M. Kanechika, N. Soejima, T. Uesugi, T. Kachi","doi":"10.1109/PCCON.2007.372994","DOIUrl":null,"url":null,"abstract":"We report on the demonstration of normally off and normally on vertical AlGaN/GaN high electron mobility transistors (HEMTs). The normally off device shows the threshold voltage of 1.6 V. The normally on device shows the normalized on resistance of 1.48 mOmega-cm2 and the maximum drain current density of 3.9 kA/cm2. Before then, the dependence of threshold voltage on the thickness of n-GaN in the structure of AlGaN/n-GaN/p-GaN was studied experimentally.","PeriodicalId":325362,"journal":{"name":"2007 Power Conversion Conference - Nagoya","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-04-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 Power Conversion Conference - Nagoya","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PCCON.2007.372994","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16
Abstract
We report on the demonstration of normally off and normally on vertical AlGaN/GaN high electron mobility transistors (HEMTs). The normally off device shows the threshold voltage of 1.6 V. The normally on device shows the normalized on resistance of 1.48 mOmega-cm2 and the maximum drain current density of 3.9 kA/cm2. Before then, the dependence of threshold voltage on the thickness of n-GaN in the structure of AlGaN/n-GaN/p-GaN was studied experimentally.