Post-undulator beam measurements with PolariX TDS in SwissFEL

P. Craievich, Z. Geng, F. Marcellini, C. Kittel, S. Reiche, T. Schietinger, G. Wang, E. Prat
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Abstract

Radiofrequency (RF) transverse deflection structures (TDSs) are fundamental time-resolved diagnostics in x-ray free-electron lasers. Two x-band TDSs with variable polarization of the deflecting force were recently installed after the undulators of Athos, the soft x-ray beamline of SwissFEL. This contribution summarizes the experience gained over the last few months during the commissioning of the RF system and the measurements made during operations, focusing on the setup of the entire complex RF system, the calibration and the time-resolved measurement that, combined with an energy spectrometer, provides longitudinal phase-space measurements of extreme importance for the commissioning of the complex FEL schemes implemented in the Athos beamline.
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用PolariX TDS在瑞士电子激光器中测量后波动光束
射频(RF)横向偏转结构(tds)是x射线自由电子激光器中基本的时间分辨诊断。最近,在瑞士自由电子激光器软x射线束流线Athos的波动器之后,安装了两个可变偏转力偏振的x波段tds。这篇文章总结了过去几个月在射频系统调试期间获得的经验和在运行期间进行的测量,重点是整个复杂射频系统的设置,校准和时间分辨测量,结合能谱仪,提供纵向相空间测量,对于在Athos光束线中实施的复杂FEL方案的调试至关重要。
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