{"title":"Deriving Error Bounds on Measured Noise Factors Using Active Device Verification","authors":"S. Van den Bosch, L. Martens","doi":"10.1109/ARFTG.1999.327371","DOIUrl":null,"url":null,"abstract":"We have implemented an active device verification procedure for noise factor measurements into existing commercially available noise measurement software. The method was used for verifying GaAs MESFET noise factor measurements. Also, an approximation was developed, providing an error on the measured 50¿ noise factors.","PeriodicalId":284470,"journal":{"name":"54th ARFTG Conference Digest","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"54th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1999.327371","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
We have implemented an active device verification procedure for noise factor measurements into existing commercially available noise measurement software. The method was used for verifying GaAs MESFET noise factor measurements. Also, an approximation was developed, providing an error on the measured 50¿ noise factors.
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