{"title":"On the measurement of high resistance semiconductors by the van der Pauw method","authors":"M. Morvic","doi":"10.1109/ASDAM.2000.889512","DOIUrl":null,"url":null,"abstract":"We measured transport parameters of semiinsulating (SI) and low temperature (LT) GaAs using the van der Pauw method. A detailed procedure for semiinsulating sample preparation and for obtaining reliable experimental data is given. The advantage of using a constant voltage source instead of a constant current source is demonstrated in the case of high resistivity semiconductor materials.","PeriodicalId":303962,"journal":{"name":"ASDAM 2000. Conference Proceedings. Third International EuroConference on Advanced Semiconductor Devices and Microsystems (Cat. No.00EX386)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ASDAM 2000. Conference Proceedings. Third International EuroConference on Advanced Semiconductor Devices and Microsystems (Cat. No.00EX386)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASDAM.2000.889512","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
We measured transport parameters of semiinsulating (SI) and low temperature (LT) GaAs using the van der Pauw method. A detailed procedure for semiinsulating sample preparation and for obtaining reliable experimental data is given. The advantage of using a constant voltage source instead of a constant current source is demonstrated in the case of high resistivity semiconductor materials.
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