{"title":"Ferroelectric SPICE model, testing and fitting","authors":"S. Summerfelt, John Rodriguez, H. McAdams","doi":"10.1109/ISAF.2008.4693963","DOIUrl":null,"url":null,"abstract":"Design of ferroelectric memories, F-RAMs, requires an accurate ferroelectric SPICE model. The goal of a good SPICE model is to predict the behavior of the ferroelectric capacitor in the circuit environment.","PeriodicalId":228914,"journal":{"name":"2008 17th IEEE International Symposium on the Applications of Ferroelectrics","volume":"152 6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 17th IEEE International Symposium on the Applications of Ferroelectrics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISAF.2008.4693963","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Design of ferroelectric memories, F-RAMs, requires an accurate ferroelectric SPICE model. The goal of a good SPICE model is to predict the behavior of the ferroelectric capacitor in the circuit environment.
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