Luc Enthoven, J. V. Staveren, Jiang Gong, M. Babaie, F. Sebastiano
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引用次数: 4
Abstract
This paper presents a 15b cryo-CMOS DAC for multiplexed spin-qubit biasing implemented in a 22-nm FinFET process. The integrating-DAC architecture and the robust digitally-assisted high-voltage output stage enable a low power dissipation (157μW) and small area (0.08mm2) independent of the number of biased qubits, and a 3V output range well beyond the nominal supply. This represents the first scalable solution for cryo-CMOS qubit biasing, which achieves a 1.8× better voltage resolution with a lower DNL over a 3× larger output range than the current state-of-the-art.