{"title":"Checkered White-RGB Color LOFIC CMOS image sensor","authors":"Shun Kawada, Shin Sakai, Y. Tashiro, S. Sugawa","doi":"10.1109/ASPDAC.2010.5419870","DOIUrl":null,"url":null,"abstract":"We succeeded in developing a checkered White-RGB color CMOS image sensor based on a lateral overflow integration capacitor (LOFIC) architecture. The LOFIC CMOS image sensor with a 1/3.3-inch optical format, 1280<sup>H</sup> × 480<sup>V</sup> pixels, 4.2-µm effective pixel pitch along with 45° direction was designed and fabricated through 0.18-µm 2-Poly 3-Metal CMOS technology with buried pinned photodiode (PD) process. The image sensor has achieved about 108-µV/ē high conversion gain and about 102-dB dynamic range (DR) performance in one exposure.","PeriodicalId":152569,"journal":{"name":"2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-01-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASPDAC.2010.5419870","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
We succeeded in developing a checkered White-RGB color CMOS image sensor based on a lateral overflow integration capacitor (LOFIC) architecture. The LOFIC CMOS image sensor with a 1/3.3-inch optical format, 1280H × 480V pixels, 4.2-µm effective pixel pitch along with 45° direction was designed and fabricated through 0.18-µm 2-Poly 3-Metal CMOS technology with buried pinned photodiode (PD) process. The image sensor has achieved about 108-µV/ē high conversion gain and about 102-dB dynamic range (DR) performance in one exposure.