{"title":"Conducted emission of I/O pins near power pairs of a microcontroller integrated circuit","authors":"Shuai Ma, Min Pan, Wenxiao Fang, P. Lai","doi":"10.1109/APEMC.2016.7522915","DOIUrl":null,"url":null,"abstract":"In this paper, we investigate the conducted emission of I/O pins near power pairs of a microcontroller integrated circuit. Our investigation show that with the increase of the distance from the power pairs the I/O pin gives decreasing conducted emission. The spread of the conducted emission from power pairs to I/O pins can be depicted by mutual inductance and mutual capacitor in a lumped circuit model.","PeriodicalId":358257,"journal":{"name":"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-05-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEMC.2016.7522915","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract
In this paper, we investigate the conducted emission of I/O pins near power pairs of a microcontroller integrated circuit. Our investigation show that with the increase of the distance from the power pairs the I/O pin gives decreasing conducted emission. The spread of the conducted emission from power pairs to I/O pins can be depicted by mutual inductance and mutual capacitor in a lumped circuit model.
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