E. Baier, R. Clemen, W. Haug, W. Fischer, R. Mueller, W. Loehlein, H. Barsuhn
{"title":"A 256K NMOS DRAM","authors":"E. Baier, R. Clemen, W. Haug, W. Fischer, R. Mueller, W. Loehlein, H. Barsuhn","doi":"10.1109/ISSCC.1984.1156712","DOIUrl":null,"url":null,"abstract":"A 80ns 256K n-channel metal-gate DRAM with tour selectable data I/O buffers which permit the chip to be used as 64K×4, 128 × 2, or 256 × 1, with either parallel or serial data transfer at 20ns data rate, will be discussed.","PeriodicalId":260117,"journal":{"name":"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"54 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1984.1156712","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
A 80ns 256K n-channel metal-gate DRAM with tour selectable data I/O buffers which permit the chip to be used as 64K×4, 128 × 2, or 256 × 1, with either parallel or serial data transfer at 20ns data rate, will be discussed.