Mixed technology of ion implantation and heteroepitaxy: ion-implanted In/sub x/Ga/sub 1-x/As/GaAs MESFETs

G. Wang, M. Feng, R. Kaliski, Y. P. Liaw, C. Lau, C. Ito
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引用次数: 0

Abstract

State-of-the-art FET performance with f/sub t/'s of 55 and 61 GHz has been achieved using 0.5- mu m-gate In/sub 0.1/Ga/sub 0.9/As and graded In/sub x/Ga/sub 1-x/As MESFETs, respectively. The material growth and device fabrication are described, and the device characteristics are reported. In comparison to the In/sub 0.1/Ga/sub 0.9/As MESFET, the graded-material MESFET shows a better Schottky gate, which is essential for device performance. This novel InGaAs MESFET is of interest for InGaAs-based circuits that are suitable, among other applications, for long-wavelength fiber-optic communication.<>
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离子注入与异质外延混合技术:离子注入In/sub x/Ga/sub 1-x/As/GaAs mesfet
采用0.5 μ m栅极In/sub 0.1/Ga/sub 0.9/As和渐变In/sub x/Ga/sub 1-x/As mesfet分别实现了55 GHz和61 GHz的f/sub t/ s的最先进的FET性能。描述了材料的生长和器件的制造,并报道了器件的特性。与In/sub 0.1/Ga/sub 0.9/As MESFET相比,渐变材料MESFET具有更好的肖特基栅极,这对器件性能至关重要。这种新颖的InGaAs MESFET适用于基于InGaAs的电路,除其他应用外,还适用于长波长光纤通信。
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