Viscosity of a no-flow underfill during reflow and its relationship to solder wetting

P. Morganelli, B. Wheelock
{"title":"Viscosity of a no-flow underfill during reflow and its relationship to solder wetting","authors":"P. Morganelli, B. Wheelock","doi":"10.1109/ECTC.2001.927712","DOIUrl":null,"url":null,"abstract":"There is much interest in understanding viscosity changes of a no-flow underfill during reflow. Viscosity changes that result from the onset of cure provide resistance to the formation of solder interconnections, and can result in a decrease in yield. The difficulty has been tracking viscosity changes during temperature profiles that vary as much as 4 degrees/second. We used microdielectrometry to make real-time ion viscosity measurements of various no-flow underfill formulations during a standard reflow temperature profile. The results clearly show the initial viscosity drop as temperature ramps up, and the point at which the effect of cure dominates and causes viscosity to rise. The data are related to DSC analysis and to solder joint yield. Overall, the results show how viscosity changes during the reflow process can potentially have a dramatic effect on assembly yield rates. The information gained is useful for developing a reflow process to form reliable solder joints.","PeriodicalId":340217,"journal":{"name":"2001 Proceedings. 51st Electronic Components and Technology Conference (Cat. No.01CH37220)","volume":"66 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2001 Proceedings. 51st Electronic Components and Technology Conference (Cat. No.01CH37220)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.2001.927712","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10

Abstract

There is much interest in understanding viscosity changes of a no-flow underfill during reflow. Viscosity changes that result from the onset of cure provide resistance to the formation of solder interconnections, and can result in a decrease in yield. The difficulty has been tracking viscosity changes during temperature profiles that vary as much as 4 degrees/second. We used microdielectrometry to make real-time ion viscosity measurements of various no-flow underfill formulations during a standard reflow temperature profile. The results clearly show the initial viscosity drop as temperature ramps up, and the point at which the effect of cure dominates and causes viscosity to rise. The data are related to DSC analysis and to solder joint yield. Overall, the results show how viscosity changes during the reflow process can potentially have a dramatic effect on assembly yield rates. The information gained is useful for developing a reflow process to form reliable solder joints.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
无流底填料在回流过程中的粘度及其与焊料润湿的关系
研究无流下填料在回流过程中的粘度变化具有重要意义。固化开始时产生的粘度变化会阻碍焊料互连的形成,并可能导致产量下降。在温度变化高达4度/秒的情况下,跟踪粘度的变化是困难的。在标准回流温度剖面下,我们使用显微介电法对各种无流底填配方进行了实时离子粘度测量。结果清楚地表明,随着温度的升高,初始粘度下降,而在这一点上,固化的影响起主导作用,导致粘度上升。这些数据与DSC分析和焊点良率有关。总体而言,结果表明,在回流过程中粘度的变化可能对装配成品率产生巨大影响。所获得的信息对开发回流工艺以形成可靠的焊点是有用的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
A quasi three-dimensional distributed electromagnetic model for complex power distribution networks Thermal fatigue properties of lead-free solders on Cu and NiP under bump metallurgies Microlens arrays with integrated thin film power monitors Intermetallic reactions between lead-free SnAgCu solder and Ni(P)/Au surface finish on PWBs Nondestructive detection of intermetallics in solder joints by high energy X-ray diffraction
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1