Thermal wake models for forced air cooling of electronic components

A. Ortega, S. Ramanathan, J. D. Chicci, J. Prince
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引用次数: 17

Abstract

Analytical solutions are presented for the temperature field which arises from the application of a source of heat on an adiabatic plate or board when the fluid is represented as a uniform flow with an effective turbulent diffusivity, the so-called UFED flow model. Solutions are summarized for a point source, a one-dimensional strip source, and a rectangular source of heat. The ability to superpose the individual kernel solutions to obtain the temperature field due to multiple sources is demonstrated. The point source solution reveals that the N/sup -1/ law commonly observed for the centerline thermal wake decay for three-dimensional arrays is predicted by the point source solution for the UFED model. The thermal wake approaches the point source behavior downstream from the source, suggesting a new scaling for the far thermal wake that successfully collapses the thermal wake for several sizes of components and provides a fundamental basis for experimental observations previously made for arrays of three-dimensional components. Preliminary experimental results using a thermochromic liquid crystal thermal mapping technique are presented.<>
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电子元件强制空气冷却的热尾流模型
本文给出了当流体被表示为具有有效湍流扩散率的均匀流动时,在绝热板或板上施加热源所产生的温度场的解析解,即所谓的UFED流动模型。总结了点源、一维条形热源和矩形热源的解法。演示了将单个核解叠加以获得由多个源引起的温度场的能力。点源解表明,UFED模型的点源解可以预测三维阵列中心线热尾迹衰减的N/sup -1/规律。热尾迹接近源下游的点源行为,为远端热尾迹提供了一种新的尺度,成功地将热尾迹坍塌为几种尺寸的组件,并为以前对三维组件阵列的实验观测提供了基础。本文介绍了热致变色液晶热成像技术的初步实验结果。
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