A quantitative measure of robustness for delay fault testing

Abstract

A quantitative measure of robustness is introduced and used to evaluate the quality of a set of test pattern pairs when multiple delay faults are present in the circuit under test. It is shown that robust test patterns discussed in many previous papers are actually special cases of the robustness measure. The measure can be used to guide the selection of test pairs for delay fault testing, and thereby improve the quality of the set of test pairs used to detect delay faults.<>