{"title":"Augmenting board test coverage with new intel powered opens boundary scan instruction","authors":"Chwee Liong Tee, T. H. Tan, Chin Chuan Ng","doi":"10.1109/TEST.2009.5355756","DOIUrl":null,"url":null,"abstract":"Serious erosion of board test access demands a re-look on the current test strategy. This paper describes implementation of Extest Toggle* and its effectiveness. Note *: Extest Toggle is a design for test (DFT) method of providing a square wave at TCK, while driving the remaining pins on the bus to a static level for guarding.","PeriodicalId":419063,"journal":{"name":"2009 International Test Conference","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2009.5355756","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Serious erosion of board test access demands a re-look on the current test strategy. This paper describes implementation of Extest Toggle* and its effectiveness. Note *: Extest Toggle is a design for test (DFT) method of providing a square wave at TCK, while driving the remaining pins on the bus to a static level for guarding.
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