{"title":"Improving Timing-Independent Testing of Crosstalk Using Realistic Assumptions on Delay Faults","authors":"Shahdad Irajpour, S. Gupta, M. Breuer","doi":"10.1109/ATS.2007.86","DOIUrl":null,"url":null,"abstract":"Test generation methodology previously developed for crosstalk targets in the presence of manufacturing defects and process variations results in low coverage. In this paper, under a realistic assumption about the nature of manufacturing defects, we show that by incorporating two new concepts, namely, non- criticality and delay-superiority, significantly higher coverage of targets and lower test generation and test application costs are achieved.","PeriodicalId":289969,"journal":{"name":"16th Asian Test Symposium (ATS 2007)","volume":"94 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"16th Asian Test Symposium (ATS 2007)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2007.86","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Test generation methodology previously developed for crosstalk targets in the presence of manufacturing defects and process variations results in low coverage. In this paper, under a realistic assumption about the nature of manufacturing defects, we show that by incorporating two new concepts, namely, non- criticality and delay-superiority, significantly higher coverage of targets and lower test generation and test application costs are achieved.