Anirudh Kumar, Priyanka Pai, V. Kavitha, S. Prashanth
{"title":"Design of X-Band Pulsed Power Amplifier & Downconverter","authors":"Anirudh Kumar, Priyanka Pai, V. Kavitha, S. Prashanth","doi":"10.1109/imarc49196.2021.9714583","DOIUrl":null,"url":null,"abstract":"This paper presents the design features, simulation & implementation of a X-band Pulsed Power Amplifier and down converter using double down conversion technique in a single mechanical housing. This module has been designed & tested for various features like high output power, high gain in PA section & low noise figure, excellent image rejection, high gain, MSTC, AGC & BITE check in Down converter section. Module is designed, fabricated & tested successfully and is meeting all the required specifications. A close match is achieved between the simulated & tested results. Mean Time Between Failure (MTBF) is predicted to be 13530Hrs.","PeriodicalId":226787,"journal":{"name":"2021 IEEE MTT-S International Microwave and RF Conference (IMARC)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2021-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE MTT-S International Microwave and RF Conference (IMARC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/imarc49196.2021.9714583","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper presents the design features, simulation & implementation of a X-band Pulsed Power Amplifier and down converter using double down conversion technique in a single mechanical housing. This module has been designed & tested for various features like high output power, high gain in PA section & low noise figure, excellent image rejection, high gain, MSTC, AGC & BITE check in Down converter section. Module is designed, fabricated & tested successfully and is meeting all the required specifications. A close match is achieved between the simulated & tested results. Mean Time Between Failure (MTBF) is predicted to be 13530Hrs.