Control of Sub-Nanosecond Precessional Magnetic Switching in STT-MRAM Cells for SRAM Applications

B. Lacoste, M. Marins de Castro, R. Sousa, I. Prejbeanu, L. Buda-Prejbeanu, S. Auffret, U. Ebels, B. Rodmacq, B. Dieny
{"title":"Control of Sub-Nanosecond Precessional Magnetic Switching in STT-MRAM Cells for SRAM Applications","authors":"B. Lacoste, M. Marins de Castro, R. Sousa, I. Prejbeanu, L. Buda-Prejbeanu, S. Auffret, U. Ebels, B. Rodmacq, B. Dieny","doi":"10.1109/IMW.2016.7495262","DOIUrl":null,"url":null,"abstract":"STT-MRAM are foreseen as the best contender for DRAM replacement. STT-MRAM could also be used for SRAM applications if switching time below 1ns could be realized in a reliable way. In this study, we demonstrate that sub-ns switching with final state determined by the current polarity through the stack can be achieved in STT-MRAM cells comprising two spin-polarizing layers having orthogonal magnetic anisotropies [1],[2]. We carried out a thorough experimental and modeling study of these ultrafast STT-MRAM. We demonstrated that a quite reliable switching can be achieved by increasing the cell aspect ratio (AR) or advantageously by applying an in-plane static transverse field on the cell. Switching in 200ps could be demonstrated with write energy less than 100fJ.","PeriodicalId":365759,"journal":{"name":"2016 IEEE 8th International Memory Workshop (IMW)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 8th International Memory Workshop (IMW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMW.2016.7495262","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

STT-MRAM are foreseen as the best contender for DRAM replacement. STT-MRAM could also be used for SRAM applications if switching time below 1ns could be realized in a reliable way. In this study, we demonstrate that sub-ns switching with final state determined by the current polarity through the stack can be achieved in STT-MRAM cells comprising two spin-polarizing layers having orthogonal magnetic anisotropies [1],[2]. We carried out a thorough experimental and modeling study of these ultrafast STT-MRAM. We demonstrated that a quite reliable switching can be achieved by increasing the cell aspect ratio (AR) or advantageously by applying an in-plane static transverse field on the cell. Switching in 200ps could be demonstrated with write energy less than 100fJ.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
用于SRAM的STT-MRAM单元的亚纳秒进动磁开关控制
STT-MRAM被认为是DRAM替代品的最佳竞争者。如果可以可靠地实现低于1ns的开关时间,STT-MRAM也可以用于SRAM应用。在本研究中,我们证明了在STT-MRAM电池中,由两个具有正交磁各向异性的自旋极化层组成的STT-MRAM电池可以实现亚ns开关,其最终状态由电流极性决定[1],[2]。我们对这些超快STT-MRAM进行了全面的实验和建模研究。我们证明了一个相当可靠的开关可以通过增加单元宽高比(AR)或有利地通过在单元上施加一个面内静态横向场来实现。在写入能量小于100fJ的情况下,可以实现200ps的开关。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
N-Doping Impact in Optimized Ge-Rich Materials Based Phase-Change Memory Threshold Switching in Amorphous Cr-Doped Vanadium Oxide for New Crossbar Selector Analytical Model to Evaluate the Role of Deep Trap State in the Reliability of NAND Flash Memory and Its Process Dependence Fully Analytical Compact Model of OxRAM Based on Joule Heating and Electromigration for DC and Pulsed Operation A Double-Data- Rate 2 (DDR2) Interface Phase-Change Memory with 533MB/s Read -Write Data Rate and 37.5ns Access Latency for Memory-Type Storage Class Memory Applications
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1