P. Vančura, J. Gečnuk, Z. Janoška, J. Jirsa, O. Korchak, A. Kostina, V. Kafka, D. Lednický, M. Marčišovská, M. Marčišovský, M. Strnad, P. Švihra, L. Tomášek, P. Staněk
{"title":"SpacePix3: SOI MAPS detector for space radiation monitoring","authors":"P. Vančura, J. Gečnuk, Z. Janoška, J. Jirsa, O. Korchak, A. Kostina, V. Kafka, D. Lednický, M. Marčišovská, M. Marčišovský, M. Strnad, P. Švihra, L. Tomášek, P. Staněk","doi":"10.1088/1748-0221/18/10/c10015","DOIUrl":null,"url":null,"abstract":"Abstract The SpacePix3 monolithic active pixel sensor is a novel ASIC for space radiation monitoring designed in a 180 nm SOI CMOS technology. The detector is capable of detecting and differentiating protons, electrons, and heavy ions. Its active sensor area is 3.84×3.84 mm 2 , pixel matrix is arranged in a 64×64 square array with 60 µm pitch. The pixel front-end amplifier signal range is 1–80 ke - , extended up to 30 Me - using a backside channel. Diodes integrated in the handle wafer in each pixel are biased at -150 V, creating a depleted layer approximately 35 µm deep. Impinging particle generates a charge pulse converted to a voltage pulse by the charge-sensitive amplifier. Maximum voltage memorized by the peak detector hold circuit is digitized using on-chip 10-bit asynchronous column SAR ADCs. Two readout interfaces are available, 400 MHz LVDS and 50 MHz SPI. Total current consumption is 31 mA from a 1.8 V power supply in the SPI mode.","PeriodicalId":16184,"journal":{"name":"Journal of Instrumentation","volume":"6 1","pages":"0"},"PeriodicalIF":1.3000,"publicationDate":"2023-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Instrumentation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1088/1748-0221/18/10/c10015","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
引用次数: 0
Abstract
Abstract The SpacePix3 monolithic active pixel sensor is a novel ASIC for space radiation monitoring designed in a 180 nm SOI CMOS technology. The detector is capable of detecting and differentiating protons, electrons, and heavy ions. Its active sensor area is 3.84×3.84 mm 2 , pixel matrix is arranged in a 64×64 square array with 60 µm pitch. The pixel front-end amplifier signal range is 1–80 ke - , extended up to 30 Me - using a backside channel. Diodes integrated in the handle wafer in each pixel are biased at -150 V, creating a depleted layer approximately 35 µm deep. Impinging particle generates a charge pulse converted to a voltage pulse by the charge-sensitive amplifier. Maximum voltage memorized by the peak detector hold circuit is digitized using on-chip 10-bit asynchronous column SAR ADCs. Two readout interfaces are available, 400 MHz LVDS and 50 MHz SPI. Total current consumption is 31 mA from a 1.8 V power supply in the SPI mode.
期刊介绍:
Journal of Instrumentation (JINST) covers major areas related to concepts and instrumentation in detector physics, accelerator science and associated experimental methods and techniques, theory, modelling and simulations. The main subject areas include.
-Accelerators: concepts, modelling, simulations and sources-
Instrumentation and hardware for accelerators: particles, synchrotron radiation, neutrons-
Detector physics: concepts, processes, methods, modelling and simulations-
Detectors, apparatus and methods for particle, astroparticle, nuclear, atomic, and molecular physics-
Instrumentation and methods for plasma research-
Methods and apparatus for astronomy and astrophysics-
Detectors, methods and apparatus for biomedical applications, life sciences and material research-
Instrumentation and techniques for medical imaging, diagnostics and therapy-
Instrumentation and techniques for dosimetry, monitoring and radiation damage-
Detectors, instrumentation and methods for non-destructive tests (NDT)-
Detector readout concepts, electronics and data acquisition methods-
Algorithms, software and data reduction methods-
Materials and associated technologies, etc.-
Engineering and technical issues.
JINST also includes a section dedicated to technical reports and instrumentation theses.