{"title":"Low frequency voltage noise in high temperature superconductor Josephson junctions","authors":"A. Marx, L. Alff, R. Gross","doi":"10.1016/S0964-1807(99)00020-4","DOIUrl":null,"url":null,"abstract":"<div><p>The origin of 1/<em>f</em><span><span> voltage noise in different types of </span>Josephson junctions<span> fabricated from the high temperature superconductors (HTS) have been traced back to the trapping and release of charge carriers in trapping centers in an insulating barrier giving rise to correlated fluctuations of the junction critical current </span></span><em>I</em><sub>c</sub> and normal state resistance <em>R</em><sub>n</sub>. For the normalized fluctuations <em>S<sub>I</sub></em> and <em>S<sub>R</sub></em> a linear scaling with <em>R</em><sub>n</sub> has been observed which suggests an almost constant density of trapping centers for all investigated HTS Josephson junctions. Using this linear scaling we have made an approximate calculation of the density of the trapping centers.</p></div>","PeriodicalId":100110,"journal":{"name":"Applied Superconductivity","volume":"6 10","pages":"Pages 621-627"},"PeriodicalIF":0.0000,"publicationDate":"1999-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/S0964-1807(99)00020-4","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Applied Superconductivity","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0964180799000204","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The origin of 1/f voltage noise in different types of Josephson junctions fabricated from the high temperature superconductors (HTS) have been traced back to the trapping and release of charge carriers in trapping centers in an insulating barrier giving rise to correlated fluctuations of the junction critical current Ic and normal state resistance Rn. For the normalized fluctuations SI and SR a linear scaling with Rn has been observed which suggests an almost constant density of trapping centers for all investigated HTS Josephson junctions. Using this linear scaling we have made an approximate calculation of the density of the trapping centers.
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