{"title":"Design and evaluation of EMPIX2, a 100 kfps, high dynamic range pixel detector readout ASIC for electron microscopy","authors":"T. Wei, H. Yang, Z. Deng, T. Xue, X. Wang","doi":"10.1088/1748-0221/18/12/C12007","DOIUrl":null,"url":null,"abstract":"EMPIX2 is a novel hybrid pixel detector readout ASIC for electron microscopy with a maximum frame rate of 100 kfps and a very large dynamic range (5 × 105:1). It features 128 × 128 square pixels at a pitch of 150 μm. Adaptive gain switching and charge pump technology are applied to enhance the dynamic range. The pixels can operate in two modes: pulse mode and continuous mode. In pulse mode, ultra-fast gain switching enables a rapid response to pulsed electron sources, making it highly suitable for UEM applications. In continuous mode, the power consumption and dynamic range are optimized for STEM applications. The readout is frame-based, and digital image data is output by 64 pairs of LVDS drivers working in DDR mode at a clock frequency of 400 MHz. A dedicated data acquisition system was developed for the transmission and processing of the image data. Preliminary verification of the readout chip was performed using an on-chip calibration source.","PeriodicalId":16184,"journal":{"name":"Journal of Instrumentation","volume":"8 11","pages":""},"PeriodicalIF":1.3000,"publicationDate":"2023-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Instrumentation","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1088/1748-0221/18/12/C12007","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
引用次数: 0
Abstract
EMPIX2 is a novel hybrid pixel detector readout ASIC for electron microscopy with a maximum frame rate of 100 kfps and a very large dynamic range (5 × 105:1). It features 128 × 128 square pixels at a pitch of 150 μm. Adaptive gain switching and charge pump technology are applied to enhance the dynamic range. The pixels can operate in two modes: pulse mode and continuous mode. In pulse mode, ultra-fast gain switching enables a rapid response to pulsed electron sources, making it highly suitable for UEM applications. In continuous mode, the power consumption and dynamic range are optimized for STEM applications. The readout is frame-based, and digital image data is output by 64 pairs of LVDS drivers working in DDR mode at a clock frequency of 400 MHz. A dedicated data acquisition system was developed for the transmission and processing of the image data. Preliminary verification of the readout chip was performed using an on-chip calibration source.
期刊介绍:
Journal of Instrumentation (JINST) covers major areas related to concepts and instrumentation in detector physics, accelerator science and associated experimental methods and techniques, theory, modelling and simulations. The main subject areas include.
-Accelerators: concepts, modelling, simulations and sources-
Instrumentation and hardware for accelerators: particles, synchrotron radiation, neutrons-
Detector physics: concepts, processes, methods, modelling and simulations-
Detectors, apparatus and methods for particle, astroparticle, nuclear, atomic, and molecular physics-
Instrumentation and methods for plasma research-
Methods and apparatus for astronomy and astrophysics-
Detectors, methods and apparatus for biomedical applications, life sciences and material research-
Instrumentation and techniques for medical imaging, diagnostics and therapy-
Instrumentation and techniques for dosimetry, monitoring and radiation damage-
Detectors, instrumentation and methods for non-destructive tests (NDT)-
Detector readout concepts, electronics and data acquisition methods-
Algorithms, software and data reduction methods-
Materials and associated technologies, etc.-
Engineering and technical issues.
JINST also includes a section dedicated to technical reports and instrumentation theses.