Shyankay Jou, Muhammad Hawary Assa, Bohr-Ran Huang, Xin-Wei Huang
{"title":"Cobalt sulfide films by sulfurizing cobalt for resistive switching memory","authors":"Shyankay Jou, Muhammad Hawary Assa, Bohr-Ran Huang, Xin-Wei Huang","doi":"10.35848/1347-4065/ad0cde","DOIUrl":null,"url":null,"abstract":"A cobalt sulfide (CoS<sub>\n<italic toggle=\"yes\">x</italic>\n</sub>) film compromising CoS<sub>2</sub> and Co<sub>9</sub>S<sub>8</sub> nanograins was formed by sulfurizing the surface of a Co film to use for resistive switching (RS) memory. The work function and band gap of the CoS<sub>\n<italic toggle=\"yes\">x</italic>\n</sub> film were measured to be 4.78 eV and 2.18 eV, respectively. The CoS<sub>\n<italic toggle=\"yes\">x</italic>\n</sub> film was used as a resistive layer together with the Co film underneath as a bottom electrode, and a Ag or Cu film as the top electrode. Both Ag/CoS<sub>\n<italic toggle=\"yes\">x</italic>\n</sub>/Co and Cu/CoS<sub>\n<italic toggle=\"yes\">x</italic>\n</sub>/Co devices exhibited bipolar RS behavior with the capability of multi-level memory storage. The conduction of both devices in low resistive states was correlated with metallic filamentary paths following ohmic conduction, whereas Schottky emission originated at the Ag/CoS<sub>\n<italic toggle=\"yes\">x</italic>\n</sub> and Cu/CoS<sub>\n<italic toggle=\"yes\">x</italic>\n</sub> interfaces dominated in the high resistance state. The performance of Ag/CoS<sub>\n<italic toggle=\"yes\">x</italic>\n</sub>/Co and Cu/CoS<sub>\n<italic toggle=\"yes\">x</italic>\n</sub>/Co devices were compared and correlated with the properties of Ag and Cu electrodes.","PeriodicalId":14741,"journal":{"name":"Japanese Journal of Applied Physics","volume":"8 1","pages":""},"PeriodicalIF":1.5000,"publicationDate":"2023-12-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Japanese Journal of Applied Physics","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.35848/1347-4065/ad0cde","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"PHYSICS, APPLIED","Score":null,"Total":0}
引用次数: 0
Abstract
A cobalt sulfide (CoSx) film compromising CoS2 and Co9S8 nanograins was formed by sulfurizing the surface of a Co film to use for resistive switching (RS) memory. The work function and band gap of the CoSx film were measured to be 4.78 eV and 2.18 eV, respectively. The CoSx film was used as a resistive layer together with the Co film underneath as a bottom electrode, and a Ag or Cu film as the top electrode. Both Ag/CoSx/Co and Cu/CoSx/Co devices exhibited bipolar RS behavior with the capability of multi-level memory storage. The conduction of both devices in low resistive states was correlated with metallic filamentary paths following ohmic conduction, whereas Schottky emission originated at the Ag/CoSx and Cu/CoSx interfaces dominated in the high resistance state. The performance of Ag/CoSx/Co and Cu/CoSx/Co devices were compared and correlated with the properties of Ag and Cu electrodes.
期刊介绍:
The Japanese Journal of Applied Physics (JJAP) is an international journal for the advancement and dissemination of knowledge in all fields of applied physics. JJAP is a sister journal of the Applied Physics Express (APEX) and is published by IOP Publishing Ltd on behalf of the Japan Society of Applied Physics (JSAP).
JJAP publishes articles that significantly contribute to the advancements in the applications of physical principles as well as in the understanding of physics in view of particular applications in mind. Subjects covered by JJAP include the following fields:
• Semiconductors, dielectrics, and organic materials
• Photonics, quantum electronics, optics, and spectroscopy
• Spintronics, superconductivity, and strongly correlated materials
• Device physics including quantum information processing
• Physics-based circuits and systems
• Nanoscale science and technology
• Crystal growth, surfaces, interfaces, thin films, and bulk materials
• Plasmas, applied atomic and molecular physics, and applied nuclear physics
• Device processing, fabrication and measurement technologies, and instrumentation
• Cross-disciplinary areas such as bioelectronics/photonics, biosensing, environmental/energy technologies, and MEMS