Study of the microstructure of Cu2SnS3 films, prepared through sulfurization of metal precursors deposited by magnetron sputtering

Abstract

We present the results of the study of the microstructure, X-ray diffraction and Raman scattering spectra of Cu2SnS3 (CTS) films synthesized at 500 o C by the sulfurization of SnCu stacked metal precursors with different annealing time. The results indicate that sulfurization time has a great influence on both composition and morphology of the film. It is shown that the process of formation of a single-phase CTS compound with a monoclinic structure and composition close to stoichiometry is completed for a synthesis time of 60 - 80 min. With an increase in the time of synthesis to 120 min, the preservation of the monoclinic structural modification of the material is observed, accompanied by a shift in the stoichiometric composition, namely copper enrichment, material delamination and degradation of microstructural characteristics. As a result, it was found that the most optimal conditions for the synthesis of a single-phase Cu2SnS3 compound of a monoclinic structure are the temperature 500 o С with the duration of the sulfurization process from 60 to 80 min.