Semi-supervised segmentation of metal-artifact contaminated industrial CT images using improved CycleGAN

Abstract

Accurate segmentation of industrial CT images is of great significance in industrial fields such as quality inspection and defect analysis. However, reconstruction of industrial CT images often suffers from typical metal artifacts caused by factors like beam hardening, scattering, statistical noise, and partial volume effects. Traditional segmentation methods are difficult to achieve precise segmentation of CT images mainly due to the presence of these metal artifacts. Furthermore, acquiring paired CT image data required by fully supervised networks proves to be extremely challenging. To address these issues, this paper introduces an improved CycleGAN approach for achieving semi-supervised segmentation of industrial CT images. This method not only eliminates the need for removing metal artifacts and noise, but also enables the direct conversion of metal artifact-contaminated images into segmented images without the requirement of paired data. The average values of quantitative assessment of image segmentation performance can reach 0.96645 for Dice Similarity Coefficient(Dice) and 0.93718 for Intersection over Union(IoU). In comparison to traditional segmentation methods, it presents significant improvements in both quantitative metrics and visual quality, provides valuable insights for further research.