A wireless neural recording microsystem with operator-based spike detection

IF 1.4 4区 物理与天体物理 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Solid-state Electronics Pub Date : 2024-04-03 DOI:10.1016/j.sse.2024.108915
Joonyoung Lim , Chae-Eun Lee , Jong-Hyun Park , Chieun Choi , Yoon-Kyu Song
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Abstract

We introduce an innovative approach that incorporates operator-based spike detection in wireless microsystems for neural signal processing. Through comparative analyses between simple thresholding and operator-based detection conducted on pre-recorded spike detection experiments, our research emphasizes the superiority of the operator-based spike detection approach. The operator-based spike detection emerges as a promising technique for miniaturized wireless neural signal devices, primarily due to its proficient noise-handling capabilities paired with reduced power consumption. Furthermore, its adaptability across various experimental conditions amplifies its versatility. Empirical tests underscored its low power requisites and compactness, emphasizing practical utility of the detection scheme in the neural microsystems. Collectively, our results mark a significant progression in wireless cerebral signal recording methodologies, paving the way for optimized wireless brain-machine interface (BMI) systems.

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具有基于操作员的尖峰检测功能的无线神经记录微型系统
我们引入了一种创新方法,将基于操作员的尖峰检测纳入无线微系统,用于神经信号处理。通过在预先录制的尖峰检测实验中对简单阈值检测和基于运算器的检测进行比较分析,我们的研究强调了基于运算器的尖峰检测方法的优越性。基于运算器的尖峰检测是微型化无线神经信号设备的一种有前途的技术,这主要是由于它具有熟练的噪声处理能力,同时还能降低功耗。此外,它在各种实验条件下的适应性也增强了其通用性。经验测试强调了它的低功耗要求和紧凑性,强调了该检测方案在神经微系统中的实用性。总之,我们的研究成果标志着无线脑信号记录方法的重大进步,为优化无线脑机接口(BMI)系统铺平了道路。
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来源期刊
Solid-state Electronics
Solid-state Electronics 物理-工程:电子与电气
CiteScore
3.00
自引率
5.90%
发文量
212
审稿时长
3 months
期刊介绍: It is the aim of this journal to bring together in one publication outstanding papers reporting new and original work in the following areas: (1) applications of solid-state physics and technology to electronics and optoelectronics, including theory and device design; (2) optical, electrical, morphological characterization techniques and parameter extraction of devices; (3) fabrication of semiconductor devices, and also device-related materials growth, measurement and evaluation; (4) the physics and modeling of submicron and nanoscale microelectronic and optoelectronic devices, including processing, measurement, and performance evaluation; (5) applications of numerical methods to the modeling and simulation of solid-state devices and processes; and (6) nanoscale electronic and optoelectronic devices, photovoltaics, sensors, and MEMS based on semiconductor and alternative electronic materials; (7) synthesis and electrooptical properties of materials for novel devices.
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