{"title":"Comparative Analysis of Non-Invasive Measurement Methods for Optimizing Architectural Documentation","authors":"Serhan Tuncer, U. Avdan","doi":"10.26833/ijeg.1424881","DOIUrl":null,"url":null,"abstract":"Architectural documentation not only plays a critical role in the conservation of historical structures, but also enables their detailed comprehension of the structure. This study aims to assess the most effective methods for drawing and modeling architectural structures and present their advantages and disadvantages. Measurements play a significant role in this context, and today's technology offers the potential to accelerate this process and enhance accuracy. However, the application of these technologies can impose additional burdens such as elevated expenses, the requisite for specialized personnel, and the management of substantial data volumes. Therefore, determining the appropriate measurement method in line with the quality of architectural documentation is essential. For this study, the Mosque of Kurşunlu Complex in Eskişehir was selected for its historical and topographical attributes which enabled all methods to be examined. The data produced via terrestrial laser scanning, aerial photogrammetry and terrestrial photogrammetry methods were examined in terms of the production of drawings and models for different analysis methods such as structure, daylight and building acoustics, as well as survey drawings required for the architectural documentation processes of the building. The study concluded that no single method could produce holistic data on its own, and the best results for comprehensive documentation were achieved by integrating terrestrial laser scanning and aerial photogrammetry. Furthermore, for products that do not require comprehensive data, photogrammetric methods were more efficient.","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"19 8","pages":""},"PeriodicalIF":4.7000,"publicationDate":"2024-02-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.26833/ijeg.1424881","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Architectural documentation not only plays a critical role in the conservation of historical structures, but also enables their detailed comprehension of the structure. This study aims to assess the most effective methods for drawing and modeling architectural structures and present their advantages and disadvantages. Measurements play a significant role in this context, and today's technology offers the potential to accelerate this process and enhance accuracy. However, the application of these technologies can impose additional burdens such as elevated expenses, the requisite for specialized personnel, and the management of substantial data volumes. Therefore, determining the appropriate measurement method in line with the quality of architectural documentation is essential. For this study, the Mosque of Kurşunlu Complex in Eskişehir was selected for its historical and topographical attributes which enabled all methods to be examined. The data produced via terrestrial laser scanning, aerial photogrammetry and terrestrial photogrammetry methods were examined in terms of the production of drawings and models for different analysis methods such as structure, daylight and building acoustics, as well as survey drawings required for the architectural documentation processes of the building. The study concluded that no single method could produce holistic data on its own, and the best results for comprehensive documentation were achieved by integrating terrestrial laser scanning and aerial photogrammetry. Furthermore, for products that do not require comprehensive data, photogrammetric methods were more efficient.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
Indexed/Abstracted:
Web of Science SCIE
Scopus
CAS
INSPEC
Portico