Prediction of wrinkle patterns in tensioned thin-film structures containing rigid elements

Abstract

With the in-depth study of thin-film structures, nonuniform thin films with rigid elements have been applied in the aerospace and flexible electronics industries. For thin-film structures with rigid elements, there is an interaction force between the rigid element and the thin film; therefore, the wrinkling mode of the thin film changes under the influence of the interaction force. In this study, a wrinkle model was developed to predict the wrinkle morphology of thin-film structures with rigid elements on the diagonal. First, the wrinkle patterns of the rigid elements were observed at different positions using tensile experiments. Then, the relationship between the tilt of the rigid element and the wrinkle wavelength was investigated using a finite-element eigenvalue buckling analysis. Finally, local wrinkling caused by the perturbed stress of the rigid element was introduced, and a wrinkling model of a square thin film with rigid elements on the diagonal under tension was established. The theoretical analysis results were compared with simulation and experimental results, demonstrating that the model can accurately describe the wrinkle patterns of thin-film structures containing rigid elements on the diagonal under tension.