{"title":"The Internal Consistency of the Moral Injury Event Scale","authors":"S. Steen, G. U. Law, Chris Jones","doi":"10.1027/1015-5759/a000824","DOIUrl":null,"url":null,"abstract":"Abstract: The Moral Injury Event Scale (MIES) is a tool for measuring exposure to potentially morally injurious event(s) and distress. Although it reported acceptable psychometric properties in its initial development studies, it has since been used in multiple contexts and populations without assessment of its changing properties. A reliability generalization of the MIES and its Sub-Scales was therefore undertaken. A systematic search of electronic databases (PsychINFO; PTSD Pubs; MEDLINE; Scopus; Web of Science) identified 42 studies reporting internal consistencies (Cronbach’s α) up to April 2022. Unfortunately, few studies reported any other form of reliability or validity metric (e.g., test-retest, inter-rater reliability). A random effects model with a Bayesian analytic framework and the DerSimonian-Laird (1986) estimate was used. The review found the MIES to be an internally consistent tool based on α estimates at both Full-scale (α = .88; 95% CI [.87–.89]) and Sub-scales (α = .82–.92; 95% CI [.79–.93]). The review uncovered high heterogeneity and inconsistencies in its administration and modification although figures generally remained above acceptable levels (α ≥ .70). Based on the review, the MIES represents an internally reliably tool for measuring potentially morally injurious events and distress at both Full and Sub-Scales according to pooled Cronbach’s α estimates.","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"44 5","pages":""},"PeriodicalIF":4.7000,"publicationDate":"2024-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"102","ListUrlMain":"https://doi.org/10.1027/1015-5759/a000824","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Abstract: The Moral Injury Event Scale (MIES) is a tool for measuring exposure to potentially morally injurious event(s) and distress. Although it reported acceptable psychometric properties in its initial development studies, it has since been used in multiple contexts and populations without assessment of its changing properties. A reliability generalization of the MIES and its Sub-Scales was therefore undertaken. A systematic search of electronic databases (PsychINFO; PTSD Pubs; MEDLINE; Scopus; Web of Science) identified 42 studies reporting internal consistencies (Cronbach’s α) up to April 2022. Unfortunately, few studies reported any other form of reliability or validity metric (e.g., test-retest, inter-rater reliability). A random effects model with a Bayesian analytic framework and the DerSimonian-Laird (1986) estimate was used. The review found the MIES to be an internally consistent tool based on α estimates at both Full-scale (α = .88; 95% CI [.87–.89]) and Sub-scales (α = .82–.92; 95% CI [.79–.93]). The review uncovered high heterogeneity and inconsistencies in its administration and modification although figures generally remained above acceptable levels (α ≥ .70). Based on the review, the MIES represents an internally reliably tool for measuring potentially morally injurious events and distress at both Full and Sub-Scales according to pooled Cronbach’s α estimates.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
Indexed/Abstracted:
Web of Science SCIE
Scopus
CAS
INSPEC
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