{"title":"Techniques for detecting and masking faults in semantic segmentation applications","authors":"Stéphane Burel , Adrian Evans , Lorena Anghel","doi":"10.1016/j.microrel.2024.115397","DOIUrl":null,"url":null,"abstract":"<div><p>Semantic segmentation of images is essential for many applications including autonomous driving and modern DNNs now achieve high accuracy. Automotive systems are safety critical systems and in turn they must comply with safety standards, requiring at least hardware fault detection capability. Small embedded applications also require some level of fault tolerance, while operating with a tight power budget. In this paper, we first present a detailed analysis of the effects of faults using Google’s DeepLabV3+ network processing an industrial data-set. Further to that, two techniques to mitigate hardware faults are proposed. The first one is a symptom-based fault detection algorithm shown to detect <span><math><mo>></mo></math></span>99% of critical faults with zero false positives and a compute overhead of 0.2%. The second one is a simpler technique, using a clipped ReLU activation function, to quickly mask over 99% of the critical faults in the activation values.</p></div>","PeriodicalId":51131,"journal":{"name":"Microelectronics Reliability","volume":"157 ","pages":"Article 115397"},"PeriodicalIF":1.6000,"publicationDate":"2024-05-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0026271424000775/pdfft?md5=ab7f5a1dc7df4567e359a7d1675b14ad&pid=1-s2.0-S0026271424000775-main.pdf","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Reliability","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0026271424000775","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Semantic segmentation of images is essential for many applications including autonomous driving and modern DNNs now achieve high accuracy. Automotive systems are safety critical systems and in turn they must comply with safety standards, requiring at least hardware fault detection capability. Small embedded applications also require some level of fault tolerance, while operating with a tight power budget. In this paper, we first present a detailed analysis of the effects of faults using Google’s DeepLabV3+ network processing an industrial data-set. Further to that, two techniques to mitigate hardware faults are proposed. The first one is a symptom-based fault detection algorithm shown to detect 99% of critical faults with zero false positives and a compute overhead of 0.2%. The second one is a simpler technique, using a clipped ReLU activation function, to quickly mask over 99% of the critical faults in the activation values.
期刊介绍:
Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.
Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.