Structural, Microstructural, and Electrical Properties Study of Pb(Sn0.45Ti0.55)O3 Ceramics

Abstract

We undertook a comprehensive investigation of the the structural, dielectric, and electrical characteristics of Pb(Sn_0.45Ti_0.55)O₃ ceramics prepared using the conventional solid-state route. A meticulous preparation protocol, involving solvating various precursors, was followed by extensive characterization employing X-ray diffraction, scanning electron microscopy, and dielectric studies. The synthesized sample features a single-phase tetragonal structure with P4mm symmetry. Using impedance spectroscopy, electrical transport properties of the polycrystalline Pb(Sn_0.45Ti_0.55)O₃(PST) ceramic were studied in detail. Relaxation and conduction mechanisms of the material were inferred using complex impedance, complex electric modulus, and frequency dependent ac conductivity analysis. Impedance spectroscopy results reveal the range of frequencies in which the grain, grain boundary, and electrode effects are dominant. Above certain temperatures, the imaginary component of impedance (Z^//) exhibits some resonant type peaks at different frequencies indicating relaxor nature of the sample. The activation energy obtained for both the relaxation and conduction process indicates the role of doubly-ionized oxygen vacancy in the conduction mechanism of the sample. The dielectric relaxation occurring at low frequency and high temperatures is related to the space charges associated with the ionized oxygen vacancies being trapped at the grain boundaries. The Cole-Cole plots confirm the poly-dispersive nature of dielectric relaxation in the sample.