Inductance and Q‐factor of micro‐magnetic inductor are enhanced by FeCoB films with self‐bias

IF 2.5 4区 物理与天体物理 Q3 MATERIALS SCIENCE, MULTIDISCIPLINARY Physica Status Solidi-Rapid Research Letters Pub Date : 2024-06-21 DOI:10.1002/pssr.202400167
Chao Sun, Dalong Qiu, Peng Li, Zhao Yao, Weihua Zong, Shandong Li
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Abstract

As technology progresses, the operational frequencies of electronic devices have migrated into the GHz range. As an important electronic device, the compatibility of the preparation process of inductors with integrated circuits also needs to be improved. Currently, most commercial inductors are constructed from ferrite materials, making them challenging to integrate with integrated circuits. In this study, FeCoB films with a self‐biased ferromagnetic frequency up to 21 GHz were deposited on Si substrates using the compositional gradient sputtering method as a magnetic underlayer. A reasonable inductance structure is designed using HFSS simulation software. A series of planar spiral inductors with various turns were fabricated by photolithographic micromachining on the FeCoB films with a polyimide insertion between them. The preparation process is completely based on semiconductor technology and has good compatibility with integrated circuits. The results show that the inductance L and quality factor Q are greatly improved by the introduction of high‐frequency FeCoB film. The inductance is improved by 71% and the quality factor is improved by 166%. This clearly demonstrates that FeCoB thin films are highly suitable for use as inductor cores and can be seamlessly integrated with integrated circuits, offering excellent prospects for use in high‐frequency integrated circuits.This article is protected by copyright. All rights reserved.
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带有自偏压的铁钴薄膜增强了微型磁性电感器的电感和 Q 因子
随着技术的进步,电子设备的工作频率已进入 GHz 范围。电感器作为一种重要的电子设备,其制备工艺与集成电路的兼容性也有待提高。目前,大多数商用电感器都是由铁氧体材料制成的,因此与集成电路的集成具有一定的难度。本研究采用成分梯度溅射法在硅基底上沉积了自偏压铁磁频率高达 21 GHz 的铁钴薄膜作为磁性底层。利用 HFSS 仿真软件设计了合理的电感结构。通过光刻微加工技术在铁钴薄膜上制作了一系列具有不同匝数的平面螺旋电感器,并在它们之间插入了聚酰亚胺。该制备工艺完全基于半导体技术,与集成电路具有良好的兼容性。结果表明,引入高频铁钴薄膜后,电感 L 和品质因数 Q 得到了极大改善。电感提高了 71%,品质因数提高了 166%。这清楚地表明,铁钴薄膜非常适合用作电感器磁芯,并且可以与集成电路无缝集成,在高频集成电路中的应用前景十分广阔。本文受版权保护,保留所有权利。
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来源期刊
Physica Status Solidi-Rapid Research Letters
Physica Status Solidi-Rapid Research Letters 物理-材料科学:综合
CiteScore
5.20
自引率
3.60%
发文量
208
审稿时长
1.4 months
期刊介绍: Physica status solidi (RRL) - Rapid Research Letters was designed to offer extremely fast publication times and is currently one of the fastest double peer-reviewed publication media in solid state and materials physics. Average times are 11 days from submission to first editorial decision, and 12 days from acceptance to online publication. It communicates important findings with a high degree of novelty and need for express publication, as well as other results of immediate interest to the solid-state physics and materials science community. Published Letters require approval by at least two independent reviewers. The journal covers topics such as preparation, structure and simulation of advanced materials, theoretical and experimental investigations of the atomistic and electronic structure, optical, magnetic, superconducting, ferroelectric and other properties of solids, nanostructures and low-dimensional systems as well as device applications. Rapid Research Letters particularly invites papers from interdisciplinary and emerging new areas of research.
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