Transition Radiation on a Conducting Target Shaped as a Right Dihedral Angle

V. V. Syshchenko, A. I. Tarnovsky, V. A. Krivtsov
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Abstract

The transition radiation of a charged particle in the simplest case of incidence on an infinitely conductive, ideal plane can be described based on the well-known method of images from electrostatics. This method also enables finding the distribution of fields in more complex cases, such as the field of a point particle in the presence of two intersecting conducting planes, the angle between which divides the angle 180° evenly. Based on the method of images, we describe the transition radiation that occurs when a fast charged particle strikes a target consisting of two conducting half-planes intersecting at right angles (from the inside of a dihedral angle). The characteristics of radiation emitted by fast and slow particles are qualitatively examined, and their visual interpretation is given. The possibility of using interference effects arising from radiation for monitoring beams of charged particles is discussed.

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形如直角二面角的导电目标上的过渡辐射
摘要带电粒子的过渡辐射在最简单的情况下,即入射到一个无限导电的理想平面上,可以根据众所周知的静电图像方法来描述。这种方法还能在更复杂的情况下找到场的分布,例如在两个相交的导电平面(它们之间的夹角平分了 180°)中点粒子的场。基于图像方法,我们描述了快速带电粒子撞击由两个直角相交的导电半平面(从二面角内侧)组成的目标时发生的过渡辐射。对快速粒子和慢速粒子发出的辐射特征进行了定性研究,并给出了直观解释。讨论了利用辐射产生的干扰效应来监测带电粒子束的可能性。
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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