{"title":"A transient-enhanced output-capacitorless LDO regulator with non-inverting pull–push gain stage","authors":"","doi":"10.1016/j.mejo.2024.106299","DOIUrl":null,"url":null,"abstract":"<div><p>A novel non-inverting pull–push gain stage output-capacitorless low-dropout regulator (OCL-LDO) is introduced, designed specifically for power management of system-on-chip (SoC). The incorporation of an innovative non-inverting gain stage (NIGS) serves to shift the non-dominant parasitic poles to higher frequencies, thereby enhancing the overall stability of the system. The proposed pull-push configuration markedly improves the slew rate limitation at the gate of the power transistor. Post-layout simulation outcomes, corroborated through a 180-nm CMOS fabrication process, indicate that the proposed LDO regulator maintains stability across a wide range of loading currents, from 0 mA to 100 mA, with a Miller compensation capacitance of only 3.5 pF. The circuit operates with a quiescent current of 143 μA when powered by a 1.5 V single supply. The LDO regulator boasts a dropout voltage of 300 mV, enabling it to deliver up to 100 mA of load current. Simulation results show that the undershoot voltage is only 63.7 mV when the load current jumps from 0 to 100 mA with edge of 100 ns, while employing a 100 pF capacitance load. The recovery time to return to equilibrium post this abrupt change is approximately 0.15 μs. The proposed OCL-LDO regulator exhibits a substantial enhancement in transient response compared to its predecessors, alongside a harmonized balance between line regulation and load regulation performance parameters.</p></div>","PeriodicalId":49818,"journal":{"name":"Microelectronics Journal","volume":null,"pages":null},"PeriodicalIF":1.9000,"publicationDate":"2024-07-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1879239124000031","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
A novel non-inverting pull–push gain stage output-capacitorless low-dropout regulator (OCL-LDO) is introduced, designed specifically for power management of system-on-chip (SoC). The incorporation of an innovative non-inverting gain stage (NIGS) serves to shift the non-dominant parasitic poles to higher frequencies, thereby enhancing the overall stability of the system. The proposed pull-push configuration markedly improves the slew rate limitation at the gate of the power transistor. Post-layout simulation outcomes, corroborated through a 180-nm CMOS fabrication process, indicate that the proposed LDO regulator maintains stability across a wide range of loading currents, from 0 mA to 100 mA, with a Miller compensation capacitance of only 3.5 pF. The circuit operates with a quiescent current of 143 μA when powered by a 1.5 V single supply. The LDO regulator boasts a dropout voltage of 300 mV, enabling it to deliver up to 100 mA of load current. Simulation results show that the undershoot voltage is only 63.7 mV when the load current jumps from 0 to 100 mA with edge of 100 ns, while employing a 100 pF capacitance load. The recovery time to return to equilibrium post this abrupt change is approximately 0.15 μs. The proposed OCL-LDO regulator exhibits a substantial enhancement in transient response compared to its predecessors, alongside a harmonized balance between line regulation and load regulation performance parameters.
期刊介绍:
Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.
The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc.
Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.