Critical challenges in the development of electronics based on two-dimensional transition metal dichalcogenides

Abstract

The development of high-performance electronic devices based on two-dimensional (2D) transition metal dichalcogenide semiconductors has recently advanced from one-off proof-of-principle demonstrations to more reproducible integrated devices. It has, in particular, reached a point where the material quality—as well as the interfaces between the metal contacts, dielectrics and 2D semiconductors—must be optimized to increase device performance. Here we examine the key immediate challenges for the development of electronics based on 2D transition metal dichalcogenides, and identify doping, p-type contacts and high-dielectric-constant dielectrics as critical issues. We argue that these challenges stem from the high density of defects present in 2D transition metal dichalcogenides, and suggest that the community focus more on the growth of high-quality materials with a low concentration of defects. We also provide recommendations on identifying industry-compatible dielectrics for these 2D devices. This Perspective explores key challenges in the development of electronics based on two-dimensional transition metal dichalcogenides, identifying defects, doping, p-type contacts and high-dielectric-constant dielectrics as critical issues.