A foreground calibration technique with multi-level dither for a 14-bit 1-MS/s SAR ADC

IF 1.9 3区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Microelectronics Journal Pub Date : 2024-07-26 DOI:10.1016/j.mejo.2024.106351
{"title":"A foreground calibration technique with multi-level dither for a 14-bit 1-MS/s SAR ADC","authors":"","doi":"10.1016/j.mejo.2024.106351","DOIUrl":null,"url":null,"abstract":"<div><p>A foreground calibration is proposed to obtain the real weights in the split capacitor digital-to-analog- converter (CDAC) of a 14-bit 1-MS/s successive-approximation-register (SAR) ADC. Since the non-linearity of high-resolution SAR ADC is mainly caused by the mismatch of capacitors, calibration of weights of more significant bits is necessary when the resolution of SAR ADC comes to more than 12 bits. By injecting a multi-level dither signal in both the calibration and conversion phases of the calibration scheme, the precision and non-linearity of SAR ADC can be significantly improved. Simulation results indicate that the peak signal-to-noise-and-distortion ratio (SNDR) and the spurious-free dynamic range (SFDR) achieve 79.93 dB and 91.21 dB by employing the proposed calibration technique in a 14-bit split-CDAC SAR ADC. Besides, integral non-linearity (INL) achieves 0.22 least-significant bit (LSB).</p></div>","PeriodicalId":49818,"journal":{"name":"Microelectronics Journal","volume":null,"pages":null},"PeriodicalIF":1.9000,"publicationDate":"2024-07-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1879239124000559","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

Abstract

A foreground calibration is proposed to obtain the real weights in the split capacitor digital-to-analog- converter (CDAC) of a 14-bit 1-MS/s successive-approximation-register (SAR) ADC. Since the non-linearity of high-resolution SAR ADC is mainly caused by the mismatch of capacitors, calibration of weights of more significant bits is necessary when the resolution of SAR ADC comes to more than 12 bits. By injecting a multi-level dither signal in both the calibration and conversion phases of the calibration scheme, the precision and non-linearity of SAR ADC can be significantly improved. Simulation results indicate that the peak signal-to-noise-and-distortion ratio (SNDR) and the spurious-free dynamic range (SFDR) achieve 79.93 dB and 91.21 dB by employing the proposed calibration technique in a 14-bit split-CDAC SAR ADC. Besides, integral non-linearity (INL) achieves 0.22 least-significant bit (LSB).

查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
针对 14 位 1-MS/s SAR ADC 的多级抖动前景校准技术
本文提出了一种前景校准方法,以获得 14 位 1-MS/s 逐次逼近寄存器(SAR)模数转换器(CDAC)的分电容数模转换器(CDAC)中的实际权重。由于高分辨率 SAR ADC 的非线性主要是由电容器的不匹配造成的,因此当 SAR ADC 的分辨率超过 12 位时,有必要校准更重要位的权重。通过在校准方案的校准和转换阶段注入多级抖动信号,可以显著提高 SAR ADC 的精度和非线性度。仿真结果表明,在 14 位 split-CDAC SAR ADC 中采用所提出的校准技术后,峰值信噪比(SNDR)和无杂散动态范围(SFDR)分别达到 79.93 dB 和 91.21 dB。此外,积分非线性度 (INL) 达到 0.22 最小有效位 (LSB)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
Microelectronics Journal
Microelectronics Journal 工程技术-工程:电子与电气
CiteScore
4.00
自引率
27.30%
发文量
222
审稿时长
43 days
期刊介绍: Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems. The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc. Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.
期刊最新文献
An enhanced efficiency 170–260 GHz frequency doubler based on three points resonance matching technique String-level compact modeling of erase operations in the body-floated vertical channel of 3D charge trapping flash memory Design of a low-power Digital-to-Pulse Converter (DPC) for in-memory-computing applications A cost-effective and highly robust triple-node-upset self-recoverable latch design based on dual-output C-elements Junctionless accumulation-mode SOI ferroelectric FinFET for synaptic weights
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1