Analytical solution for forced vibration of multilayer structures composed of plates with different geometric dimensions

IF 1.6 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Microelectronics Reliability Pub Date : 2024-07-31 DOI:10.1016/j.microrel.2024.115472
Bin Li , Xin Yao , Shuantao Li , Yongbin Ma
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Abstract

Multilayer system composed of parallel plate components with different geometric dimensions is frequently used to describe engineering objects, such as electronic assembly. In this work, an analytical method was proposed for forced vibration of this type of multilayer system. The proposed method overcomes the limitation that the traditional wave method is only applicable to all plate components must have the same in-plane dimensions. The proposed analytical method has an efficiency advantages in parameter analysis than element-based methods such as finite element method (FEM). The connection joints between two adjacent plate components, such as ball grid array (BGA) solder interconnect, are represented by elastic springs. The vibration of each component are described in terms of general and physical analytical waves, respectively, and the dynamic coupling between them are established by an equivalent dynamic flexibility matrix. The forced responses of the multilayer system are analytically calculated by solving the system equation in wave space. In the numerical examples, the effectiveness of the proposed method is validated by comparing the present results with the FEM results. The influence of number of the defective solder joints on vibration response is also investigated.

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由不同几何尺寸的板材组成的多层结构的受迫振动解析解
由具有不同几何尺寸的平行板组件组成的多层系统常用于描述工程对象,如电子组件。在这项工作中,我们提出了一种分析方法,用于分析这类多层系统的受迫振动。所提出的方法克服了传统波方法仅适用于所有板组件必须具有相同面内尺寸的限制。与有限元法(FEM)等基于元素的方法相比,所提出的分析方法在参数分析方面具有效率优势。相邻两个板状元件(如球栅阵列 (BGA) 焊料互连)之间的连接点用弹性弹簧表示。每个组件的振动分别用一般分析波和物理分析波描述,它们之间的动态耦合由等效动态弹性矩阵建立。多层系统的强迫响应是通过在波空间求解系统方程来分析计算的。在数值示例中,通过比较本结果与有限元结果,验证了所提方法的有效性。此外,还研究了缺陷焊点数量对振动响应的影响。
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来源期刊
Microelectronics Reliability
Microelectronics Reliability 工程技术-工程:电子与电气
CiteScore
3.30
自引率
12.50%
发文量
342
审稿时长
68 days
期刊介绍: Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged. Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.
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